The Scanning Electron Microscope (SEM) uses a focused beam of high-energy electrons to produce a highly magnified, highly resolved image of specimens’ surfaces. Scanning Electron Microscopy, accompanied by X-ray analysis, is considered a relatively rapid, inexpensive, and non-destructive approach to surface analysis. It is often used to survey surface analytical problems before proceeding to techniques that are more surface-sensitive and more specialized.
The primary applications for the SEM include materials analysis, microelectronics, earth sciences, biology, forensic science, and environmental studies.
The EM Center is equipped with a TESCAN MIRA 3 LMU Variable Pressure Schottky Field Emission Scanning Electron Microscope, with a maximum resolution up to 1.2 nm at 30 kV. A new technique called environmental scanning electron microscopy (ESEM) has been engaged in the system that not only retains all the performance advantages of a conventional high vacuum SEM, but also removes the high vacuum restraint of the sample environment.
For more details and to contact the facility, visit the Electron Microscopy Centre website.